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Anne Gattiker

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2008
2EEAnne Gattiker: Using test data to improve IC quality and yield. ICCAD 2008: 771-777
2007
1EEAnne Gattiker: Guest Editor's Introduction: Getting More Out of Test. IEEE Design & Test of Computers 24(5): 474-475 (2007)

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)