Anne Gattiker
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2008
2
EE
Anne Gattiker: Using test data to improve IC quality and yield.
ICCAD 2008
: 771-777
2007
1
EE
Anne Gattiker: Guest Editor's Introduction: Getting More Out of Test.
IEEE Design & Test of Computers 24
(5): 474-475 (2007)
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
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