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John Garcia

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2005
1EEGreg Yeric, Ethan Cohen, John Garcia, Kurt Davis, Esam Salem, Gary Green: Infrastructure for Successful BEOL Yield Ramp, Transfer to Manufacturing, and DFM Characterization at 65 nm and Below. IEEE Design & Test of Computers 22(3): 232-239 (2005)

Coauthor Index

1Ethan Cohen [1]
2Kurt Davis [1]
3Gary Green [1]
4Esam Salem [1]
5Greg Yeric [1]

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