| |
| 2005 | ||
|---|---|---|
| 1 | EE | Greg Yeric, Ethan Cohen, John Garcia, Kurt Davis, Esam Salem, Gary Green: Infrastructure for Successful BEOL Yield Ramp, Transfer to Manufacturing, and DFM Characterization at 65 nm and Below. IEEE Design & Test of Computers 22(3): 232-239 (2005) |
| 1 | Ethan Cohen | [1] |
| 2 | John Garcia | [1] |
| 3 | Gary Green | [1] |
| 4 | Esam Salem | [1] |
| 5 | Greg Yeric | [1] |