S. Freeman
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1997
1
EE
Debashis Bhattacharya
, S. Freeman,
W. Lin
: Optimizing Test Hardware for At-Speed Testing of Datapaths in an Integrated Circuit.
VLSI Design 1997
: 289-296
Coauthor
Index
1
Debashis Bhattacharya
[
1
]
2
W. Lin
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)