Gerald Esch Jr.

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2004

2 EE Gerald Esch Jr., Tom Chen: Design of CMOS IO Drivers with Less Sensitivity to Process, Voltage, and Temperature Variations. DELTA 2004: 312-320

1 EE Gerald Esch Jr., Tom Chen: Near-linear CMOS I/O driver with less sensitivity to process, voltage, and temperature variations. IEEE Trans. VLSI Syst. 12(11): 1253-1257 (2004)

2004
2	EE	Gerald Esch Jr., Tom Chen: Design of CMOS IO Drivers with Less Sensitivity to Process, Voltage, and Temperature Variations. DELTA 2004: 312-320
1	EE	Gerald Esch Jr., Tom Chen: Near-linear CMOS I/O driver with less sensitivity to process, voltage, and temperature variations. IEEE Trans. VLSI Syst. 12(11): 1253-1257 (2004)

Coauthor Index

1 Tom Chen [1] [2]