2003 | ||
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1 | EE | N. Duan, J. Scheer, J. Bielen, M. van Kleef: The influence of Sn-Cu-Ni(Au) and Sn-Au intermetallic compounds on the solder joint reliability of flip chips on low temperature co-fired ceramic substrates. Microelectronics Reliability 43(8): 1317-1327 (2003) |
1 | J. Bielen | [1] |
2 | M. van Kleef | [1] |
3 | J. Scheer | [1] |