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2000 | ||
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1 | EE | Valery Axelrad, Nicolas B. Cobb, M. O'Brien, Thuy Do, Tom Donnelly, Yuri Granik, Emile Y. Sahouria, Victor Boksha, Artur Balasinski: Efficient Full-Chip Yield Analysis Methodology for OPC-Corrected VLSI Designs. ISQED 2000: 461-466 |
1 | Valery Axelrad | [1] |
2 | Artur Balasinski | [1] |
3 | Victor Boksha | [1] |
4 | Nicolas B. Cobb | [1] |
5 | Thuy Do | [1] |
6 | Yuri Granik | [1] |
7 | M. O'Brien | [1] |
8 | Emile Y. Sahouria | [1] |