Dieu Van Dinh

2005
2	EE	Darren Aaberge, Ken Mockler, Dieu Van Dinh, Raoul Belleau, Tim Donovan, Reid Hewlitt: Meeting the Test Challenges of the 1 Gbps Parallel RapidIO Interface with New Automatic Test Equipment Capabilities. VTS 2005: 75-84
2000
1		Dieu Van Dinh, Virginia Rabitoy: An approach to testing 200 ps echo clock to output timing on the double data rate synchronous memory. ITC 2000: 610-618

Coauthor Index

1	Darren Aaberge	[2]
2	Raoul Belleau	[2]
3	Tim Donovan	[2]
4	Reid Hewlitt	[2]
5	Ken Mockler	[2]
6	Virginia Rabitoy	[1]

Colors in the list of coauthors