| |
| 2003 | ||
|---|---|---|
| 1 | EE | Ajit R. Dhamdhere, Ajay P. Malshe, William F. Schmidt, William D. Brown: Investigation of reliability issues in high power laser diode bar packages. Microelectronics Reliability 43(2): 287-295 (2003) |
| 1 | William D. Brown | [1] |
| 2 | Ajay P. Malshe | [1] |
| 3 | William F. Schmidt | [1] |