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Zahari Mohamed Darus

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1999
2EEMd. Altaf-Ul-Amin, Zahari Mohamed Darus: VHDL Design of a Test Processor Based on Mixed-Mode Test Generation. Great Lakes Symposium on VLSI 1999: 244-
1998
1EEMd. Altaf-Ul-Amin, Zahari Mohamed Darus: An Off-Chip Current Sensor for IDDQ Testing of CMOS ICs. Asian Test Symposium 1998: 318-322

Coauthor Index

1Md. Altaf-Ul-Amin [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)