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1999 | ||
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2 | EE | Md. Altaf-Ul-Amin, Zahari Mohamed Darus: VHDL Design of a Test Processor Based on Mixed-Mode Test Generation. Great Lakes Symposium on VLSI 1999: 244- |
1998 | ||
1 | EE | Md. Altaf-Ul-Amin, Zahari Mohamed Darus: An Off-Chip Current Sensor for IDDQ Testing of CMOS ICs. Asian Test Symposium 1998: 318-322 |
1 | Md. Altaf-Ul-Amin | [1] [2] |