| |
| 2007 | ||
|---|---|---|
| 2 | EE | Eric R. Marsh, Jeremiah A. Couey, R. Ryan Vallance, Allen Y. Yi: The role of crystallographic orientation on the forces generated in ultra-precision grinding of anisotropic materials such as monocrystalline silicon. IJMTM 12(1/2/3): 270-283 (2007) |
| 2005 | ||
| 1 | EE | Jeremiah A. Couey, Eric R. Marsh, Byron R. Knapp, R. Ryan Vallance: In-process force monitoring for precision grinding semiconductor silicon wafers. IJMTM 7(5/6): 430-440 (2005) |
| 1 | Byron R. Knapp | [1] |
| 2 | Eric R. Marsh | [1] [2] |
| 3 | R. Ryan Vallance | [1] [2] |
| 4 | Allen Y. Yi | [2] |