| |
| 1994 | ||
|---|---|---|
| 2 | Brenda S. Cantell, Randall S. Collica, José G. Ramírez: Statistical analysis of Particle/Defect Data Experiments Using Poisson and Logistic Regression. DFT 1994: 230-238 | |
| 1993 | ||
| 1 | Randall S. Collica: A Logistic Regression Yield Model for SRAM Bit Fail Patterns. DFT 1993: 127-135 | |
| 1 | Brenda S. Cantell | [2] |
| 2 | José G. Ramírez | [2] |