Dan Cline
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1997
1
Theo J. Powell
, Dan Cline,
Francis Hii
: A 256Meg SDRAM BIST for Disturb Test Application.
ITC 1997
: 200-208
Coauthor
Index
1
Francis Hii
[
1
]
2
Theo J. Powell
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
