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Kun Young Chung

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2006
2EEKun Young Chung, Sandeep K. Gupta: Low-Cost Scan-Based Delay Testing of Latch-Based Circuits with Time Borrowing. VTS 2006: 8-15
2003
1EEKun Young Chung, Sandeep K. Gupta: Structural Delay Testing of Latch-based High-speed Pipelines with Time Borrowing. ITC 2003: 1089-1097

Coauthor Index

1Sandeep K. Gupta [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)