Kun Young Chung

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2006

2 EE Kun Young Chung, Sandeep K. Gupta: Low-Cost Scan-Based Delay Testing of Latch-Based Circuits with Time Borrowing. VTS 2006: 8-15

2003

1 EE Kun Young Chung, Sandeep K. Gupta: Structural Delay Testing of Latch-based High-speed Pipelines with Time Borrowing. ITC 2003: 1089-1097

2006
2	EE	Kun Young Chung, Sandeep K. Gupta: Low-Cost Scan-Based Delay Testing of Latch-Based Circuits with Time Borrowing. VTS 2006: 8-15
2003
1	EE	Kun Young Chung, Sandeep K. Gupta: Structural Delay Testing of Latch-based High-speed Pipelines with Time Borrowing. ITC 2003: 1089-1097

Coauthor Index

1 Sandeep K. Gupta [1] [2]