Luo Chun

2005
2	EE	Luo Chun, Yang Jun, Gao Gugang, Shi Longxing: Domain fault model and coverage metric for SoC verification. ISCAS (6) 2005: 5662-5665
1	EE	Luo Chun, Yang Jun, Shi Longxing, Wu XuFan, Zhang Yu: Domain Strategy and Coverage Metric for Validation. ISQED 2005: 40-45

Coauthor Index

1	Gao Gugang	[2]
2	Yang Jun	[1] [2]
3	Shi Longxing	[1] [2]
4	Wu XuFan	[1]
5	Zhang Yu	[1]