Gao Gugang
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2005
1
EE
Luo Chun
,
Yang Jun
, Gao Gugang,
Shi Longxing
: Domain fault model and coverage metric for SoC verification.
ISCAS (6) 2005
: 5662-5665
Coauthor
Index
1
Luo Chun
[
1
]
2
Yang Jun
[
1
]
3
Shi Longxing
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
