Beom-Ik Cheon
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1994
1
Beom-Ik Cheon,
Walter Anheier
,
Rainer Laur
: A New Strategy for Test Pattern Generation in Sequential Circuits.
ISCAS 1994
: 77-80
Coauthor
Index
1
Walter Anheier
[
1
]
2
Rainer Laur
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
