Jann-Pygn Chen

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2002

1 EE Jann-Pygn Chen, W. L. Pearn: Testing process performance based on the yield: an application to the liquid-crystal display module. Microelectronics Reliability 42(8): 1235-1241 (2002)

2002
1	EE	Jann-Pygn Chen, W. L. Pearn: Testing process performance based on the yield: an application to the liquid-crystal display module. Microelectronics Reliability 42(8): 1235-1241 (2002)

Coauthor Index

1 W. L. Pearn [1]