Hajdin Ceric

List of publications from the DBLP Bibliography Server - FAQ

2002

1 EE Hajdin Ceric, Siegfried Selberherr: Simulative prediction of the resistance change due to electromigration induced void evolution. Microelectronics Reliability 42(9-11): 1457-1460 (2002)

2002
1	EE	Hajdin Ceric, Siegfried Selberherr: Simulative prediction of the resistance change due to electromigration induced void evolution. Microelectronics Reliability 42(9-11): 1457-1460 (2002)

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