M. R. Carriero
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2002
1
EE
M. R. Carriero,
S. Di Pascoli
,
Giuseppe Iannaccone
: Simulation of failure time distributions of metal lines under electromigration.
Microelectronics Reliability 42
(9-11): 1469-1472 (2002)
Coauthor
Index
1
Giuseppe Iannaccone
[
1
]
2
S. Di Pascoli
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
