W. S. Burton

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2003

1 EE W. Dauksher, W. S. Burton: An examination of the applicability of the DNP metric on first level reliability assessments in underfilled electronic packages. Microelectronics Reliability 43(12): 2011-2020 (2003)

2003
1	EE	W. Dauksher, W. S. Burton: An examination of the applicability of the DNP metric on first level reliability assessments in underfilled electronic packages. Microelectronics Reliability 43(12): 2011-2020 (2003)

Coauthor Index

1 W. Dauksher [1]