Piotr Bratek
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2001
1
EE
Piotr Bratek,
Andrzej Kos
: A method of thermal testing of microsystems.
Microelectronics Reliability 41
(11): 1877-1887 (2001)
Coauthor
Index
1
Andrzej Kos
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
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