T. Boutchacha
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2002
1
EE
G. Ghibaudo
, T. Boutchacha: Electrical noise and RTS fluctuations in advanced CMOS devices.
Microelectronics Reliability 42
(4-5): 573-582 (2002)
Coauthor
Index
1
G. Ghibaudo
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)