| |
| 1996 | ||
|---|---|---|
| 1 | EE | Jaume Segura, C. Benito, A. Rubio, Charles F. Hawkins: A detailed analysis and electrical modeling of gate oxide shorts in MOS transistors. J. Electronic Testing 8(3): 229-239 (1996) |
| 1 | Charles F. Hawkins | [1] |
| 2 | A. Rubio | [1] |
| 3 | Jaume Segura | [1] |