Stephen C. Bateman

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1992

1 Stephen C. Bateman, William H. Kao: Simulation of an Integrated Design and Test Environment for Mixed-Signal Integrated Circuits. ITC 1992: 405-414

1992
1		Stephen C. Bateman, William H. Kao: Simulation of an Integrated Design and Test Environment for Mixed-Signal Integrated Circuits. ITC 1992: 405-414

Coauthor Index

1 William H. Kao [1]