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W. David Ballew

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1992
3EEW. David Ballew, Lauren M. Streb: Board-level boundary scan: regaining observability with an additional IC. IEEE Trans. on CAD of Integrated Circuits and Systems 11(1): 68-75 (1992)
1989
2 W. David Ballew, Lauren M. Streb: Board-Level Boundary-Scan: Regaining Observability with an Additional IC. ITC 1989: 182-189
1988
1 W. David Ballew, Lauren M. Streb: Elimination of Incoming Test Based Upon In-Process Failure and Repair Costs. ITC 1988: 308-313

Coauthor Index

1Lauren M. Streb [1] [2] [3]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)