| |
| 1992 | ||
|---|---|---|
| 3 | EE | W. David Ballew, Lauren M. Streb: Board-level boundary scan: regaining observability with an additional IC. IEEE Trans. on CAD of Integrated Circuits and Systems 11(1): 68-75 (1992) |
| 1989 | ||
| 2 | W. David Ballew, Lauren M. Streb: Board-Level Boundary-Scan: Regaining Observability with an Additional IC. ITC 1989: 182-189 | |
| 1988 | ||
| 1 | W. David Ballew, Lauren M. Streb: Elimination of Incoming Test Based Upon In-Process Failure and Repair Costs. ITC 1988: 308-313 | |
| 1 | Lauren M. Streb | [1] [2] [3] |