1994 |
3 | EE | Magdy S. Abadir,
Ashish R. Parikh,
Linda Bal,
Peter Sandborn,
Ken Drake:
Analyzing Multichip Module Testing Strategies.
IEEE Design & Test of Computers 11(1): 40-52 (1994) |
2 | EE | Magdy S. Abadir,
Ashish Parikh,
Linda Bal,
Peter Sandborn,
Cynthia Murphy:
High Level Test Economics Advisor (Hi-TEA).
J. Electronic Testing 5(2-3): 195-206 (1994) |
1 | EE | Peter Sandborn,
Rajarshi Ghosh,
Ken Drake,
Magdy S. Abadir,
Linda Bal,
Ashish Parikh:
Multichip systems trade-off analysis tool.
J. Electronic Testing 5(2-3): 207-218 (1994) |