| |
| 1994 | ||
|---|---|---|
| 2 | Arno Kunzmann, Frank Böhland: Gate-Delay Fault Test with Conventional Scan-Design. EDAC-ETC-EUROASIC 1994: 524-528 | |
| 1 | EE | Arno Kunzmann, Frank Böhland: Self-test of sequential circuits with deterministic test pattern sequences. J. Electronic Testing 5(2-3): 307-312 (1994) |
| 1 | Arno Kunzmann | [1] [2] |