1997 | ||
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1 | EE | Robert D. Allen, Gregory M. Wallraff, Donald C. Hofer, Roderick R. Kunz: Photoresists for 193-nm lithography. IBM Journal of Research and Development 41(1&2): 95-104 (1997) |
1 | Donald C. Hofer | [1] |
2 | Roderick R. Kunz | [1] |
3 | Gregory M. Wallraff | [1] |