Noohul Basheer Zain Ali

2006
1	EE	Noohul Basheer Zain Ali, Mark Zwolinski, Bashir M. Al-Hashimi, Peter Harrod: Dynamic Voltage Scaling Aware Delay Fault Testing. European Test Symposium 2006: 15-20

Coauthor Index

1	Bashir M. Al-Hashimi	[1]
2	Peter Harrod	[1]
3	Mark Zwolinski	[1]