Robert Aitken

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2008

1 EE Vikas Chandra, Robert Aitken: Impact of Technology and Voltage Scaling on the Soft Error Susceptibility in Nanoscale CMOS. DFT 2008: 114-122

2008
1	EE	Vikas Chandra, Robert Aitken: Impact of Technology and Voltage Scaling on the Soft Error Susceptibility in Nanoscale CMOS. DFT 2008: 114-122

Coauthor Index

1 Vikas Chandra [1]