DEFECTS 2008:
Seattle,
WA,
USA
Premkumar T. Devanbu, Brendan Murphy, Nachiappan Nagappan, Thomas Zimmermann (Eds.):
Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008.
ACM 2008, ISBN 978-1-60558-051-7 BibTeX
Technical papers
- Nathaniel Ayewah, William Pugh:
A report on a survey and study of static analysis users.
1-5
Electronic Edition (ACM DL) BibTeX
- Yoshiki Higo, Kenji Murao, Shinji Kusumoto, Katsuro Inoue:
Predicting fault-prone modules based on metrics transitions.
6-10
Electronic Edition (ACM DL) BibTeX
- Timea Illes-Seifert, Barbara Paech:
Exploring the relationship of history characteristics and defect count: an empirical study.
11-15
Electronic Edition (ACM DL) BibTeX
- Yue Jiang, Bojan Cukic, Tim Menzies:
Can data transformation help in the detection of fault-prone modules?
16-20
Electronic Edition (ACM DL) BibTeX
- Rudolf Ramler:
The impact of product development on the lifecycle of defects.
21-25
Electronic Edition (ACM DL) BibTeX
- Burak Turhan, Ayse Basar Bener, Tim Menzies:
Nearest neighbor sampling for cross company defect predictors: abstract only.
26
Electronic Edition (ACM DL) BibTeX
- Elaine J. Weyuker, Thomas J. Ostrand:
Comparing methods to identify defect reports in a change management database.
27-31
Electronic Edition (ACM DL) BibTeX
- Chadd C. Williams, Jaime Spacco:
SZZ revisited: verifying when changes induce fixes.
32-36
Electronic Edition (ACM DL) BibTeX
Short papers
Copyright © Sat May 16 23:26:28 2009
by Michael Ley (ley@uni-trier.de)
