Kenji Murao

2008
2	EE	Yoshiki Higo, Kenji Murao, Shinji Kusumoto, Katsuro Inoue: Predicting fault-prone modules based on metrics transitions. DEFECTS 2008: 6-10
2006
1	EE	Kenji Ohno, Hiroki Matsumoto, Kenji Murao: A Switched-Voltage High-Accuracy Sample/Hold Circuit. APCCAS 2006: 179-182

Coauthor Index

1	Yoshiki Higo	[2]
2	Katsuro Inoue	[2]
3	Shinji Kusumoto	[2]
4	Hiroki Matsumoto	[1]
5	Kenji Ohno	[1]

Colors in the list of coauthors