Software Quality Journal, Volume 10

Volume 10, Number 1, July 2002

• James M. Bieman:
  In This Issue. 5-6
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• James M. Bieman:
  Editorial: Risks to Software Quality. 7-9
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• John Moses, Malcolm Farrow, Peter Smith:
  Statistical Methods for Predicting and Improving Cohesion Using Information Flow: An Empirical Study. 11-46
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• William G. Tuohey:
  Benefits and Effective Application of Software Engineering Standards. 47-68
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• Houman Younessi, Panlop Zeephongsekul, Winai Bodhisuwan:
  A General Model of Unit Testing Efficacy. 69-92
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Volume 10, Number 2, September 2002

• Margaret Ross:
  In This Issue. 99-100
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• Ita Richardson:
  SPI Models: What Characteristics are Required for Small Software Development Companies? 101-114
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• Jonathan Vincent, Graham King, Peter Lay, John Kinghorn:
  Principles of Built-In-Test for Run-Time-Testability in Component-Based Software Systems. 115-133
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• John Moses:
  Measuring Effort Estimation Uncertainty to Improve Client Confidence. 135-148
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• Boris I. Cogan, Elena Shalfeeva:
  A Generalized Structural Model of Structured Programs for Software Metrics Definition. 149-167
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• Kerstin V. Siakas, Elli Georgiadou:
  Empirical Measurement of the Effects of Cultural Diversity on Software Quality Management. 169-180
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• Mercedes Ruiz, Isabel Ramos, Miguel Toro:
  A Dynamic Integrated Framework for Software Process Improvement. 181-194
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Volume 10, Number 3, November 2002

• James M. Bieman:
  In This Issue. 199-200
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• James M. Bieman:
  Editorial: Why Good Software Goes Bad. 201-203
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• Jessica Chen, Suganthan Subramaniam:
  Specification-based Testing for Gui-based Applications. 205-224
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• Anneliese Amschler Andrews, Chunhui Zhu, Michael Scheetz, Eric Dahlman, Adele E. Howe:
  AI Planner Assisted Test Generation. 225-259
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• José Antonio Calvo-Manzano Villalón, Gonzalo Cuevas Agustín, Tomás San Feliu Gilabert, Antonio de Amescua Seco, Luis García Sánchez, Manuel Pérez Cota:
  Experiences in the Application of Software Process Improvement in SMES. 261-273
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Volume 10, Number 4, December 2002

• James M. Bieman:
  In This Issue. 279-280
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• Margaret Ross:
  Editorial: The Y2K Legacy-The Time Bomb of Tomorrow. 281-283
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• Margaret Ross:
  Quality in Web Design for Visually Impaired Users. 285-298
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• Catherine Stringfellow, Anneliese Amschler Andrews:
  Deriving a Fault Architecture to Guide Testing. 299-330
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• Zuhoor A. Al-Khanjari, Martin R. Woodward, Haider Ali Ramadhan:
  Critical Analysis of the PIE Testability Technique. 331-354
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• Alexander Chatzigeorgiou, George Stephanides:
  Energy Metric for Software Systems. 355-371
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