Y. Zonan
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2001
1
EE
Irith Pomeranz
, Y. Zonan: Testing of scan circuits containing nonisolated random-logic legacycores.
IEEE Trans. on CAD of Integrated Circuits and Systems 20
(8): 980-993 (2001)
Coauthor
Index
1
Irith Pomeranz
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)