| |
| 2002 | ||
|---|---|---|
| 1 | EE | Sudha Gopalan, Benno H. Krabbenborg, Jan-Hein Egbers, Bart van Velzen, Rene Zingg: Reliability of power transistors against application driven temperature swings. Microelectronics Reliability 42(9-11): 1623-1628 (2002) |
| 1 | Jan-Hein Egbers | [1] |
| 2 | Sudha Gopalan | [1] |
| 3 | Benno H. Krabbenborg | [1] |
| 4 | Bart van Velzen | [1] |