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| 2008 | ||
|---|---|---|
| 1 | EE | Josef Haid, Bernd Zimek, Thomas Leutgeb, Thomas Kunemund: Impact of Leakage Current on Data Retention of RF-powered Devices During Amplitude-Modulation-based Communication. DATE 2008: 784-787 |
| 1 | Josef Haid | [1] |
| 2 | Thomas Kunemund | [1] |
| 3 | Thomas Leutgeb | [1] |