| |
| 2002 | ||
|---|---|---|
| 2 | EE | Lei Du, Yiqi Zhuang, Yong Wu: 1/fgamma Noise separated from white noise with wavelet denoising. Microelectronics Reliability 42(2): 183-188 (2002) |
| 1 | EE | Yiqi Zhuang, Lei Du: 1/f noise as a reliability indicator for subsurface Zener diodes. Microelectronics Reliability 42(3): 355-360 (2002) |
| 1 | Lei Du | [1] [2] |
| 2 | Yong Wu | [2] |