2005 | ||
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2 | EE | J. M. Zhang, J. G. Sun: Quantitative assessment of subsurface damage depth in silicon wafers based on optical transmission properties. IJMTM 7(5/6): 540-552 (2005) |
1986 | ||
1 | K. J. MacCallum, J. M. Zhang: Curve-Smoothing Techniques Using B-Splines. Comput. J. 29(6): 564-571 (1986) |
1 | K. J. MacCallum | [1] |
2 | J. G. Sun | [2] |