J. G. Sun

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2005

1 EE J. M. Zhang, J. G. Sun: Quantitative assessment of subsurface damage depth in silicon wafers based on optical transmission properties. IJMTM 7(5/6): 540-552 (2005)

2005
1	EE	J. M. Zhang, J. G. Sun: Quantitative assessment of subsurface damage depth in silicon wafers based on optical transmission properties. IJMTM 7(5/6): 540-552 (2005)

Coauthor Index

1 J. M. Zhang [1]