A. Zehe
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2002
1
EE
A. Zehe: Prediction of electromigration-void formation in copper conductors based on the electron configuration of matrix and solute atoms.
Microelectronics Reliability 42
(12): 1849-1855 (2002)
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)