| |
| 2003 | ||
|---|---|---|
| 1 | EE | Pedro Y. Piñero, Leticia Arco, María M. García, Yaile Caballero, Raykenler Yzquierdo, Alfredo Morales: Two New Metrics for Feature Selection in Pattern Recognition. CIARP 2003: 488-497 |
| 1 | Leticia Arco | [1] |
| 2 | Yaile Caballero | [1] |
| 3 | María M. García | [1] |
| 4 | Alfredo Morales | [1] |
| 5 | Pedro Y. Piñero | [1] |