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Mohammad Yunus

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2003
1EEMohammad Yunus, K. Srihari, J. M. Pitarresi, Anthony Primavera: Effect of voids on the reliability of BGA/CSP solder joints. Microelectronics Reliability 43(12): 2077-2086 (2003)

Coauthor Index

1J. M. Pitarresi [1]
2Anthony Primavera [1]
3K. Srihari [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)