| |
| 1987 | ||
|---|---|---|
| 1 | EE | Tat-Kwan Yu, Sung-Mo Kang, I. N. Haji, Timothy N. Trick: Statistical Performance Modeling and Parametric Yield Estimation of MOS VLSI. IEEE Trans. on CAD of Integrated Circuits and Systems 6(6): 1013-1022 (1987) |
| 1 | I. N. Haji | [1] |
| 2 | Sung-Mo Kang | [1] |
| 3 | Timothy N. Trick | [1] |