Meng-Fu You

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2008

1 EE Kuen-Yu Tsai, Meng-Fu You, Yi-Chang Lu, Philip C. W. Ng: A new method to improve accuracy of leakage current estimation for transistors with non-rectangular gates due to sub-wavelength lithography effects. ICCAD 2008: 286-291

2008
1	EE	Kuen-Yu Tsai, Meng-Fu You, Yi-Chang Lu, Philip C. W. Ng: A new method to improve accuracy of leakage current estimation for transistors with non-rectangular gates due to sub-wavelength lithography effects. ICCAD 2008: 286-291

Coauthor Index

1 Yi-Chang Lu [1]

2 Philip C. W. Ng [1]

3 Kuen-Yu Tsai [1]