| |
| 2002 | ||
|---|---|---|
| 1 | EE | Yoondong Park, Steve H. Jen, Bing J. Sheu, Heesook Yoon, In Gyeom Kim: An efficient parameter extraction method using statistical optimization in S-CMOS deep-submicron/nanometer model. ISCAS (5) 2002: 233-236 |
| 1 | Steve H. Jen | [1] |
| 2 | In Gyeom Kim | [1] |
| 3 | Yoondong Park | [1] |
| 4 | Bing J. Sheu | [1] |