1993 | ||
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1 | Eiichi Teraoka, Toru Kengaku, Ikuo Yasui, Kazuyuki Ishikawa, Takahiro Matsuo, Hideyuki Wakada, Narumi Sakashita, Yukihiko Shimazu, Takeshi Tokuda: A Built-in Self- Test for ADC and DAC in a Single-Chip Speech CODEC. ITC 1993: 791-796 |
1 | Kazuyuki Ishikawa | [1] |
2 | Toru Kengaku | [1] |
3 | Takahiro Matsuo | [1] |
4 | Narumi Sakashita | [1] |
5 | Yukihiko Shimazu | [1] |
6 | Eiichi Teraoka | [1] |
7 | Takeshi Tokuda | [1] |
8 | Hideyuki Wakada | [1] |