Edward J. Yarmchuk

List of publications from the DBLP Bibliography Server - FAQ

2005

1 EE Edward J. Yarmchuk, Christopher W. Cline, Dominic C. Bruen: Latent defect screening for high-reliability glass-ceramic multichip module copper interconnects. IBM Journal of Research and Development 49(4-5): 677-686 (2005)

2005
1	EE	Edward J. Yarmchuk, Christopher W. Cline, Dominic C. Bruen: Latent defect screening for high-reliability glass-ceramic multichip module copper interconnects. IBM Journal of Research and Development 49(4-5): 677-686 (2005)

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