| |
| 2001 | ||
|---|---|---|
| 1 | EE | B. P. Yan, Y. F. Yang, C. C. Hsu, H. B. Lo, E. S. Yang: A reliability comparison of InGaP/GaAs HBTs with and without passivation ledge. Microelectronics Reliability 41(12): 1959-1963 (2001) |
| 1 | C. C. Hsu | [1] |
| 2 | H. B. Lo | [1] |
| 3 | B. P. Yan | [1] |
| 4 | E. S. Yang | [1] |