| |
| 2003 | ||
|---|---|---|
| 3 | EE | Sheng Uei Guan, Pin Xie, Hong Li: A golden-block-based self-refining scheme for repetitive patterned wafer inspections. Mach. Vis. Appl. 13(5): 314-321 (2003) |
| 2000 | ||
| 2 | EE | Pin Xie, Sheng Uei Guan: A golden-template self-generating method for patterned wafer inspection. Mach. Vis. Appl. 12(3): 149-156 (2000) |
| 1999 | ||
| 1 | EE | Sheng Uei Guan, Pin Xie: A Golden Block Self-Generating Scheme for Continuous Patterned Wafer Inspections. ICIAP 1999: 436- |
| 1 | Steven Guan (Sheng Uei Guan) | [1] [2] [3] |
| 2 | Hong Li | [3] |